Shielding effects in conductive and magnetic materials were investigated as a function of properties, thickness and diameter. In this work, evaluations on passive conductive and magnetic shield specimens were achieved through experimentation set-up using 50 Hz single and three phase induction field sources. Analysis on material microstructure properties and characteristics of shielding specimens were performed with the use of vibrating sample magnetometer (VSM) and field emission scanning electron microscopy (FESEM). An induction field at 136 μT of single phase system and 50 μT of three phase systems were observed to the shield specimens with the thickness ranged of 0.2 mm to 0.4 mm. It is observed that shield specimen efficiency becomes inversely proportionate to the increment of induction fields. The decrease was attributed to the surface structure texture which relates to the crystallization and non-crystallization geometrical effects.
All Science Journal Classification (ASJC) codes
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics
- Electrical and Electronic Engineering