The bandwidth and jitter study in EPON upstream traffic

N. A.M. Radzi, N. M. Din, M. S.A. Majid, M. H. Al-Mansoori

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Abstract

Quality of Service (QoS) is of concern in Ethernet Passive Optical Network (EPON) in supporting real time traffic. This paper describes a centralized dynamic bandwidth allocation (DBA) algorithm in supporting the QoS inside both the optical line terminal and optical network units for upstream traffic. The DBA algorithm is called Universal DBA and it has been compared with other DBA algorithm to prove its advantages in terms of bandwidth utilization and jitter. It shows that UDBA algorithm improves as high as 14.7% in terms of bandwidth utilization and 17.7% in terms of jitter.

Original languageEnglish
Title of host publicationProceeding - 2013 IEEE Student Conference on Research and Development, SCOReD 2013
EditorsRosdiadee Nordin, Montadar Abas Taher, Mahamod Ismail
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages171-174
Number of pages4
ISBN (Electronic)9781479926565
DOIs
Publication statusPublished - 06 Jan 2013
Event2013 11th IEEE Student Conference on Research and Development, SCOReD 2013 - Putrajaya, Malaysia
Duration: 16 Dec 201317 Dec 2013

Publication series

NameProceeding - 2013 IEEE Student Conference on Research and Development, SCOReD 2013

Other

Other2013 11th IEEE Student Conference on Research and Development, SCOReD 2013
CountryMalaysia
CityPutrajaya
Period16/12/1317/12/13

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All Science Journal Classification (ASJC) codes

  • Control and Systems Engineering
  • Biomedical Engineering
  • Electrical and Electronic Engineering

Cite this

Radzi, N. A. M., Din, N. M., Majid, M. S. A., & Al-Mansoori, M. H. (2013). The bandwidth and jitter study in EPON upstream traffic. In R. Nordin, M. A. Taher, & M. Ismail (Eds.), Proceeding - 2013 IEEE Student Conference on Research and Development, SCOReD 2013 (pp. 171-174). [7002565] (Proceeding - 2013 IEEE Student Conference on Research and Development, SCOReD 2013). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/SCOReD.2013.7002565