Technique to improve visibility for cycle time improvement in semiconductor manufacturing

Syahril Ridzuan Ab Rahim, Ibrahim Ahmad, Mohd Azizi Chik

Research output: Chapter in Book/Report/Conference proceedingConference contribution

7 Citations (Scopus)

Abstract

Cycle time for a product is one of the key performance indicators in semiconductor manufacturing. Reduction of cycle time will shorten product time to market, increase throughput, reduce operational cost and develop customer trust. Semiconductor manufacturing that process 40,000 to 50,000 work-in-progresses (WIP), usually takes 50 to 70 days, 300 to 400 equipments and 300 to 900 steps to complete. Thus, any task related to manual data collection to make indices reports or analysis usually needs high resources requirements to spend for manual work and risk for mistake. In the modern facility of semiconductor fabrication, a system like Manufacturing Execution Systems (MES) was implemented to ease the process and operation traceability. The information is well kept in the appropriate databases. Many applications then are integrated with MES database to perform indices reports. In this paper, the improve method for data collection related to cycle time improvement is introduced. In this approach, the automated systems was developed using existing Advance Productivity Family (APF) programming platform to collecting the data. The system is integrated between MES and APF to have the real time data collection and analysis. In the systems, manual data collection is replaced with respective automated data transfer from real situation in the manufacturing environment. This program then able to shows real root caused with proper relational charting to display real problem for engineering to prioritize and resolve respectively. As a result, 39% reduction of cycle time gained by implementing this technique. The system has successfully implemented and supports the cycle time reduction.

Original languageEnglish
Title of host publication2012 10th IEEE International Conference on Semiconductor Electronics, ICSE 2012 - Proceedings
Pages627-630
Number of pages4
DOIs
Publication statusPublished - 01 Dec 2012
Event2012 10th IEEE International Conference on Semiconductor Electronics, ICSE 2012 - Kuala Lumpur, Malaysia
Duration: 19 Sep 201221 Sep 2012

Publication series

Name2012 10th IEEE International Conference on Semiconductor Electronics, ICSE 2012 - Proceedings

Other

Other2012 10th IEEE International Conference on Semiconductor Electronics, ICSE 2012
CountryMalaysia
CityKuala Lumpur
Period19/09/1221/09/12

Fingerprint

Visibility
Semiconductor materials
Productivity
Data transfer
Throughput
Fabrication
Costs

All Science Journal Classification (ASJC) codes

  • Hardware and Architecture
  • Electrical and Electronic Engineering

Cite this

Rahim, S. R. A., Ahmad, I., & Chik, M. A. (2012). Technique to improve visibility for cycle time improvement in semiconductor manufacturing. In 2012 10th IEEE International Conference on Semiconductor Electronics, ICSE 2012 - Proceedings (pp. 627-630). [6417223] (2012 10th IEEE International Conference on Semiconductor Electronics, ICSE 2012 - Proceedings). https://doi.org/10.1109/SMElec.2012.6417223
Rahim, Syahril Ridzuan Ab ; Ahmad, Ibrahim ; Chik, Mohd Azizi. / Technique to improve visibility for cycle time improvement in semiconductor manufacturing. 2012 10th IEEE International Conference on Semiconductor Electronics, ICSE 2012 - Proceedings. 2012. pp. 627-630 (2012 10th IEEE International Conference on Semiconductor Electronics, ICSE 2012 - Proceedings).
@inproceedings{1b06fd1b343449bb9ac2ff238115bbaa,
title = "Technique to improve visibility for cycle time improvement in semiconductor manufacturing",
abstract = "Cycle time for a product is one of the key performance indicators in semiconductor manufacturing. Reduction of cycle time will shorten product time to market, increase throughput, reduce operational cost and develop customer trust. Semiconductor manufacturing that process 40,000 to 50,000 work-in-progresses (WIP), usually takes 50 to 70 days, 300 to 400 equipments and 300 to 900 steps to complete. Thus, any task related to manual data collection to make indices reports or analysis usually needs high resources requirements to spend for manual work and risk for mistake. In the modern facility of semiconductor fabrication, a system like Manufacturing Execution Systems (MES) was implemented to ease the process and operation traceability. The information is well kept in the appropriate databases. Many applications then are integrated with MES database to perform indices reports. In this paper, the improve method for data collection related to cycle time improvement is introduced. In this approach, the automated systems was developed using existing Advance Productivity Family (APF) programming platform to collecting the data. The system is integrated between MES and APF to have the real time data collection and analysis. In the systems, manual data collection is replaced with respective automated data transfer from real situation in the manufacturing environment. This program then able to shows real root caused with proper relational charting to display real problem for engineering to prioritize and resolve respectively. As a result, 39{\%} reduction of cycle time gained by implementing this technique. The system has successfully implemented and supports the cycle time reduction.",
author = "Rahim, {Syahril Ridzuan Ab} and Ibrahim Ahmad and Chik, {Mohd Azizi}",
year = "2012",
month = "12",
day = "1",
doi = "10.1109/SMElec.2012.6417223",
language = "English",
isbn = "9781467323963",
series = "2012 10th IEEE International Conference on Semiconductor Electronics, ICSE 2012 - Proceedings",
pages = "627--630",
booktitle = "2012 10th IEEE International Conference on Semiconductor Electronics, ICSE 2012 - Proceedings",

}

Rahim, SRA, Ahmad, I & Chik, MA 2012, Technique to improve visibility for cycle time improvement in semiconductor manufacturing. in 2012 10th IEEE International Conference on Semiconductor Electronics, ICSE 2012 - Proceedings., 6417223, 2012 10th IEEE International Conference on Semiconductor Electronics, ICSE 2012 - Proceedings, pp. 627-630, 2012 10th IEEE International Conference on Semiconductor Electronics, ICSE 2012, Kuala Lumpur, Malaysia, 19/09/12. https://doi.org/10.1109/SMElec.2012.6417223

Technique to improve visibility for cycle time improvement in semiconductor manufacturing. / Rahim, Syahril Ridzuan Ab; Ahmad, Ibrahim; Chik, Mohd Azizi.

2012 10th IEEE International Conference on Semiconductor Electronics, ICSE 2012 - Proceedings. 2012. p. 627-630 6417223 (2012 10th IEEE International Conference on Semiconductor Electronics, ICSE 2012 - Proceedings).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

TY - GEN

T1 - Technique to improve visibility for cycle time improvement in semiconductor manufacturing

AU - Rahim, Syahril Ridzuan Ab

AU - Ahmad, Ibrahim

AU - Chik, Mohd Azizi

PY - 2012/12/1

Y1 - 2012/12/1

N2 - Cycle time for a product is one of the key performance indicators in semiconductor manufacturing. Reduction of cycle time will shorten product time to market, increase throughput, reduce operational cost and develop customer trust. Semiconductor manufacturing that process 40,000 to 50,000 work-in-progresses (WIP), usually takes 50 to 70 days, 300 to 400 equipments and 300 to 900 steps to complete. Thus, any task related to manual data collection to make indices reports or analysis usually needs high resources requirements to spend for manual work and risk for mistake. In the modern facility of semiconductor fabrication, a system like Manufacturing Execution Systems (MES) was implemented to ease the process and operation traceability. The information is well kept in the appropriate databases. Many applications then are integrated with MES database to perform indices reports. In this paper, the improve method for data collection related to cycle time improvement is introduced. In this approach, the automated systems was developed using existing Advance Productivity Family (APF) programming platform to collecting the data. The system is integrated between MES and APF to have the real time data collection and analysis. In the systems, manual data collection is replaced with respective automated data transfer from real situation in the manufacturing environment. This program then able to shows real root caused with proper relational charting to display real problem for engineering to prioritize and resolve respectively. As a result, 39% reduction of cycle time gained by implementing this technique. The system has successfully implemented and supports the cycle time reduction.

AB - Cycle time for a product is one of the key performance indicators in semiconductor manufacturing. Reduction of cycle time will shorten product time to market, increase throughput, reduce operational cost and develop customer trust. Semiconductor manufacturing that process 40,000 to 50,000 work-in-progresses (WIP), usually takes 50 to 70 days, 300 to 400 equipments and 300 to 900 steps to complete. Thus, any task related to manual data collection to make indices reports or analysis usually needs high resources requirements to spend for manual work and risk for mistake. In the modern facility of semiconductor fabrication, a system like Manufacturing Execution Systems (MES) was implemented to ease the process and operation traceability. The information is well kept in the appropriate databases. Many applications then are integrated with MES database to perform indices reports. In this paper, the improve method for data collection related to cycle time improvement is introduced. In this approach, the automated systems was developed using existing Advance Productivity Family (APF) programming platform to collecting the data. The system is integrated between MES and APF to have the real time data collection and analysis. In the systems, manual data collection is replaced with respective automated data transfer from real situation in the manufacturing environment. This program then able to shows real root caused with proper relational charting to display real problem for engineering to prioritize and resolve respectively. As a result, 39% reduction of cycle time gained by implementing this technique. The system has successfully implemented and supports the cycle time reduction.

UR - http://www.scopus.com/inward/record.url?scp=84874173037&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84874173037&partnerID=8YFLogxK

U2 - 10.1109/SMElec.2012.6417223

DO - 10.1109/SMElec.2012.6417223

M3 - Conference contribution

SN - 9781467323963

T3 - 2012 10th IEEE International Conference on Semiconductor Electronics, ICSE 2012 - Proceedings

SP - 627

EP - 630

BT - 2012 10th IEEE International Conference on Semiconductor Electronics, ICSE 2012 - Proceedings

ER -

Rahim SRA, Ahmad I, Chik MA. Technique to improve visibility for cycle time improvement in semiconductor manufacturing. In 2012 10th IEEE International Conference on Semiconductor Electronics, ICSE 2012 - Proceedings. 2012. p. 627-630. 6417223. (2012 10th IEEE International Conference on Semiconductor Electronics, ICSE 2012 - Proceedings). https://doi.org/10.1109/SMElec.2012.6417223