Tan delta measurement of paper insulated laminates using capacitance method from 300kHz to 50MHz

Ahmad Basri Ghani, Chandan Kumar Chakrabarty, Wong Jee Keen Raymond, Chin Hock Goh

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Tan delta measurement of oil impregnated kraft paper extracted from paper insulated lead covered cables (PILC) has been performed using a parallel plate capacitor and a vector network analyzer (VNA) from 30kHz to 50MHz. The material under test (MUT) is flat and thin sample clamped between the capacitor plates and connected to the VNA to obtain its two port S parameters. The S parameter is converted into impedance to calculate the complex permittivity using Matlab program. Techniques used to overcome the air gap and stray capacitance was described. Measurement obtained using the proposed method was compared with the free space method to validate its accuracy. The percent difference is less than 5%.

Original languageEnglish
Title of host publicationICSD 2013 - Proceedings of the 2013 IEEE International Conference on Solid Dielectrics
Pages996-1000
Number of pages5
DOIs
Publication statusPublished - 01 Dec 2013
EventICSD 2013 - Proceedings of the 2013 IEEE International Conference on Solid Dielectrics - Bologna, Italy
Duration: 30 Jun 201304 Jul 2013

Publication series

NameProceedings of IEEE International Conference on Solid Dielectrics, ICSD
ISSN (Print)1553-5282
ISSN (Electronic)2159-1687

Other

OtherICSD 2013 - Proceedings of the 2013 IEEE International Conference on Solid Dielectrics
CountryItaly
CityBologna
Period30/06/1304/07/13

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All Science Journal Classification (ASJC) codes

  • Electrical and Electronic Engineering
  • Electronic, Optical and Magnetic Materials
  • Materials Chemistry
  • Condensed Matter Physics

Cite this

Ghani, A. B., Kumar Chakrabarty, C., Raymond, W. J. K., & Goh, C. H. (2013). Tan delta measurement of paper insulated laminates using capacitance method from 300kHz to 50MHz. In ICSD 2013 - Proceedings of the 2013 IEEE International Conference on Solid Dielectrics (pp. 996-1000). [6619728] (Proceedings of IEEE International Conference on Solid Dielectrics, ICSD). https://doi.org/10.1109/ICSD.2013.6619728