Super-heterodyne interferometer for non-contact dielectric measurements on millimeter wave material

Goh Chin Hock, Chandan Kumar Chakrabarty, Mohammad Hadi Badjian, Sanjay Devkumar, Emilliano

Research output: Chapter in Book/Report/Conference proceedingConference contribution

4 Citations (Scopus)

Abstract

This paper describes the use of AD8302 evaluation board from Analog Devices in superheterodyne millimeter wave interferometer for dielectric measurement. The measurements are performed without direct contact on the millimeter wave material. Signals from the output of two mixers in the interferometer were obtained for phase shifting analysis. They are used as inputs to the evaluation board. The output from the evaluation board was connected to computer for data processing. The voltage values obtained from the board was then converted to phase angle by using the pre-calibrated data and LabView™ graphical programming language.

Original languageEnglish
Title of host publication2008 IEEE International RF and Microwave Conference, RFM 2008
Pages167-170
Number of pages4
DOIs
Publication statusPublished - 01 Dec 2008
Event2008 IEEE International RF and Microwave Conference, RFM 2008 - Kuala Lumpur, Malaysia
Duration: 02 Dec 200804 Dec 2008

Publication series

Name2008 IEEE International RF and Microwave Conference, RFM 2008

Other

Other2008 IEEE International RF and Microwave Conference, RFM 2008
CountryMalaysia
CityKuala Lumpur
Period02/12/0804/12/08

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All Science Journal Classification (ASJC) codes

  • Computer Networks and Communications
  • Hardware and Architecture
  • Electrical and Electronic Engineering

Cite this

Hock, G. C., Chakrabarty, C. K., Badjian, M. H., Devkumar, S., & Emilliano (2008). Super-heterodyne interferometer for non-contact dielectric measurements on millimeter wave material. In 2008 IEEE International RF and Microwave Conference, RFM 2008 (pp. 167-170). [4897416] (2008 IEEE International RF and Microwave Conference, RFM 2008). https://doi.org/10.1109/RFM.2008.4897416