Simultaneous measurement of structure and XUV dielectric constant of nanoscale objects using diffraction of high harmonic radiation

B. Mills, Chien Fat Chau, E. T.F. Rogers, J. Grant-Jacob, S. L. Stebbings, M. Praeger, A. M. De Paula, C. A. Froud, R. T. Chapman, T. J. Butcher, W. S. Brocklesby, J. G. Frey

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

XUV diffraction using radiation generated by high harmonic generation is used simultaneously to determine both the structure and the complex refractive index of a partially ordered array of 196 nm diameter polystyrene spheres.

Original languageEnglish
Title of host publication2009 Conference on Lasers and Electro-Optics and 2009 Conference on Quantum Electronics and Laser Science Conference, CLEO/QELS 2009
Publication statusPublished - 2009
Event2009 Conference on Lasers and Electro-Optics and 2009 Conference on Quantum Electronics and Laser Science Conference, CLEO/QELS 2009 - Baltimore, MD, United States
Duration: 02 Jun 200904 Jun 2009

Other

Other2009 Conference on Lasers and Electro-Optics and 2009 Conference on Quantum Electronics and Laser Science Conference, CLEO/QELS 2009
CountryUnited States
CityBaltimore, MD
Period02/06/0904/06/09

Fingerprint

Polystyrenes
Harmonic generation
Refractive index
Permittivity
Diffraction
Radiation

All Science Journal Classification (ASJC) codes

  • Electrical and Electronic Engineering
  • Electronic, Optical and Magnetic Materials

Cite this

Mills, B., Chau, C. F., Rogers, E. T. F., Grant-Jacob, J., Stebbings, S. L., Praeger, M., ... Frey, J. G. (2009). Simultaneous measurement of structure and XUV dielectric constant of nanoscale objects using diffraction of high harmonic radiation. In 2009 Conference on Lasers and Electro-Optics and 2009 Conference on Quantum Electronics and Laser Science Conference, CLEO/QELS 2009 [5225078]
Mills, B. ; Chau, Chien Fat ; Rogers, E. T.F. ; Grant-Jacob, J. ; Stebbings, S. L. ; Praeger, M. ; De Paula, A. M. ; Froud, C. A. ; Chapman, R. T. ; Butcher, T. J. ; Brocklesby, W. S. ; Frey, J. G. / Simultaneous measurement of structure and XUV dielectric constant of nanoscale objects using diffraction of high harmonic radiation. 2009 Conference on Lasers and Electro-Optics and 2009 Conference on Quantum Electronics and Laser Science Conference, CLEO/QELS 2009. 2009.
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title = "Simultaneous measurement of structure and XUV dielectric constant of nanoscale objects using diffraction of high harmonic radiation",
abstract = "XUV diffraction using radiation generated by high harmonic generation is used simultaneously to determine both the structure and the complex refractive index of a partially ordered array of 196 nm diameter polystyrene spheres.",
author = "B. Mills and Chau, {Chien Fat} and Rogers, {E. T.F.} and J. Grant-Jacob and Stebbings, {S. L.} and M. Praeger and {De Paula}, {A. M.} and Froud, {C. A.} and Chapman, {R. T.} and Butcher, {T. J.} and Brocklesby, {W. S.} and Frey, {J. G.}",
year = "2009",
language = "English",
isbn = "9781557528698",
booktitle = "2009 Conference on Lasers and Electro-Optics and 2009 Conference on Quantum Electronics and Laser Science Conference, CLEO/QELS 2009",

}

Mills, B, Chau, CF, Rogers, ETF, Grant-Jacob, J, Stebbings, SL, Praeger, M, De Paula, AM, Froud, CA, Chapman, RT, Butcher, TJ, Brocklesby, WS & Frey, JG 2009, Simultaneous measurement of structure and XUV dielectric constant of nanoscale objects using diffraction of high harmonic radiation. in 2009 Conference on Lasers and Electro-Optics and 2009 Conference on Quantum Electronics and Laser Science Conference, CLEO/QELS 2009., 5225078, 2009 Conference on Lasers and Electro-Optics and 2009 Conference on Quantum Electronics and Laser Science Conference, CLEO/QELS 2009, Baltimore, MD, United States, 02/06/09.

Simultaneous measurement of structure and XUV dielectric constant of nanoscale objects using diffraction of high harmonic radiation. / Mills, B.; Chau, Chien Fat; Rogers, E. T.F.; Grant-Jacob, J.; Stebbings, S. L.; Praeger, M.; De Paula, A. M.; Froud, C. A.; Chapman, R. T.; Butcher, T. J.; Brocklesby, W. S.; Frey, J. G.

2009 Conference on Lasers and Electro-Optics and 2009 Conference on Quantum Electronics and Laser Science Conference, CLEO/QELS 2009. 2009. 5225078.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

TY - GEN

T1 - Simultaneous measurement of structure and XUV dielectric constant of nanoscale objects using diffraction of high harmonic radiation

AU - Mills, B.

AU - Chau, Chien Fat

AU - Rogers, E. T.F.

AU - Grant-Jacob, J.

AU - Stebbings, S. L.

AU - Praeger, M.

AU - De Paula, A. M.

AU - Froud, C. A.

AU - Chapman, R. T.

AU - Butcher, T. J.

AU - Brocklesby, W. S.

AU - Frey, J. G.

PY - 2009

Y1 - 2009

N2 - XUV diffraction using radiation generated by high harmonic generation is used simultaneously to determine both the structure and the complex refractive index of a partially ordered array of 196 nm diameter polystyrene spheres.

AB - XUV diffraction using radiation generated by high harmonic generation is used simultaneously to determine both the structure and the complex refractive index of a partially ordered array of 196 nm diameter polystyrene spheres.

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M3 - Conference contribution

SN - 9781557528698

BT - 2009 Conference on Lasers and Electro-Optics and 2009 Conference on Quantum Electronics and Laser Science Conference, CLEO/QELS 2009

ER -

Mills B, Chau CF, Rogers ETF, Grant-Jacob J, Stebbings SL, Praeger M et al. Simultaneous measurement of structure and XUV dielectric constant of nanoscale objects using diffraction of high harmonic radiation. In 2009 Conference on Lasers and Electro-Optics and 2009 Conference on Quantum Electronics and Laser Science Conference, CLEO/QELS 2009. 2009. 5225078