Simulation of electroluminescence using a bipolar recombination model

P. L. Lewin, S. J. Dodd, A. Mohd Ariffin

Research output: Chapter in Book/Report/Conference proceedingConference contribution

5 Citations (Scopus)

Abstract

A dynamic bipolar charge recombination model originally developed to explain charge injection and electroluminescent (EL) behaviour of pin-plane polymeric resin samples under ac stress has been adapted to allow the simulation of EL from polyethylene films sandwiched in a plane-plane electrode system. The model is described and obtained results compared with experimental measurements. Comparison reveals that there is good agreement between the model and experimental data, indicating that under ac stress and in this case EL may be entirely due to charge injection and bipolar recombination.

Original languageEnglish
Title of host publication2007 International Conference on Solid Dielectrics, ICSD
Pages15-18
Number of pages4
DOIs
Publication statusPublished - 01 Dec 2007
Event2007 International Conference on Solid Dielectrics, ICSD - Winchester, United Kingdom
Duration: 08 Jul 200713 Jul 2007

Publication series

Name2007 International Conference on Solid Dielectrics, ICSD

Other

Other2007 International Conference on Solid Dielectrics, ICSD
CountryUnited Kingdom
CityWinchester
Period08/07/0713/07/07

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All Science Journal Classification (ASJC) codes

  • Electrical and Electronic Engineering

Cite this

Lewin, P. L., Dodd, S. J., & Mohd Ariffin, A. (2007). Simulation of electroluminescence using a bipolar recombination model. In 2007 International Conference on Solid Dielectrics, ICSD (pp. 15-18). [4290741] (2007 International Conference on Solid Dielectrics, ICSD). https://doi.org/10.1109/ICSD.2007.4290741