Properties of sputtered ZnS thin films for photovoltaic application

Faiazul Haque, Kazi Sajedur Rahman, Md Akhtaruzzaman, Huda Abdullah, Sieh Kiong Tiong, Nowshad Amin

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Abstract

ZnS thin films were deposited on soda lime glass substrates by RF magnetron sputtering technique with the variation in radio-frequency (RF) power. A study on the structural, surface topography, surface morphology, optical and electrical properties of the deposited ZnS thin films was carried out through XRD, AFM, FESEM, UV-vis spectrometry and Hall Effect measurement. Structural determination by XRD method indicated that the films are of polycrystalline nature with a strong preferential orientation along the (111) reflection plane exhibiting a cubic or zinc-blende structure for the films deposited at 60 W and above. The optical properties of the films were ascertained for the photon wavelength ranging from 350 to 900 nm. The bandgap was found in the range of 3.22-3.44 eV. The surface roughness and the morphology of the films were also affected by the RF powers as observed from the AFM and FESEM images.

Original languageEnglish
Article number096409
JournalMaterials Research Express
Volume5
Issue number9
DOIs
Publication statusPublished - Sep 2018

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All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Biomaterials
  • Surfaces, Coatings and Films
  • Polymers and Plastics
  • Metals and Alloys

Cite this

Haque, F., Rahman, K. S., Akhtaruzzaman, M., Abdullah, H., Tiong, S. K., & Amin, N. (2018). Properties of sputtered ZnS thin films for photovoltaic application. Materials Research Express, 5(9), [096409]. https://doi.org/10.1088/2053-1591/aad6c6