Properties of sputtered ZnS thin films for photovoltaic application

Faiazul Haque, Kazi Sajedur Rahman, Md Akhtaruzzaman, Huda Abdullah, Sieh Kiong Tiong, Nowshad Amin

Research output: Contribution to journalArticle

4 Citations (Scopus)

Abstract

ZnS thin films were deposited on soda lime glass substrates by RF magnetron sputtering technique with the variation in radio-frequency (RF) power. A study on the structural, surface topography, surface morphology, optical and electrical properties of the deposited ZnS thin films was carried out through XRD, AFM, FESEM, UV-vis spectrometry and Hall Effect measurement. Structural determination by XRD method indicated that the films are of polycrystalline nature with a strong preferential orientation along the (111) reflection plane exhibiting a cubic or zinc-blende structure for the films deposited at 60 W and above. The optical properties of the films were ascertained for the photon wavelength ranging from 350 to 900 nm. The bandgap was found in the range of 3.22-3.44 eV. The surface roughness and the morphology of the films were also affected by the RF powers as observed from the AFM and FESEM images.

Original languageEnglish
Article number096409
JournalMaterials Research Express
Volume5
Issue number9
DOIs
Publication statusPublished - 01 Sep 2018

Fingerprint

Thin films
Optical properties
Hall effect
Surface topography
Lime
Magnetron sputtering
Spectrometry
Surface morphology
Zinc
Electric properties
Energy gap
Photons
Surface roughness
Glass
Wavelength
Substrates
soda lime

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Biomaterials
  • Surfaces, Coatings and Films
  • Polymers and Plastics
  • Metals and Alloys

Cite this

Haque, F., Rahman, K. S., Akhtaruzzaman, M., Abdullah, H., Tiong, S. K., & Amin, N. (2018). Properties of sputtered ZnS thin films for photovoltaic application. Materials Research Express, 5(9), [096409]. https://doi.org/10.1088/2053-1591/aad6c6
Haque, Faiazul ; Rahman, Kazi Sajedur ; Akhtaruzzaman, Md ; Abdullah, Huda ; Tiong, Sieh Kiong ; Amin, Nowshad. / Properties of sputtered ZnS thin films for photovoltaic application. In: Materials Research Express. 2018 ; Vol. 5, No. 9.
@article{ed7891b82c2147aa8b2d55e6cc99f5e1,
title = "Properties of sputtered ZnS thin films for photovoltaic application",
abstract = "ZnS thin films were deposited on soda lime glass substrates by RF magnetron sputtering technique with the variation in radio-frequency (RF) power. A study on the structural, surface topography, surface morphology, optical and electrical properties of the deposited ZnS thin films was carried out through XRD, AFM, FESEM, UV-vis spectrometry and Hall Effect measurement. Structural determination by XRD method indicated that the films are of polycrystalline nature with a strong preferential orientation along the (111) reflection plane exhibiting a cubic or zinc-blende structure for the films deposited at 60 W and above. The optical properties of the films were ascertained for the photon wavelength ranging from 350 to 900 nm. The bandgap was found in the range of 3.22-3.44 eV. The surface roughness and the morphology of the films were also affected by the RF powers as observed from the AFM and FESEM images.",
author = "Faiazul Haque and Rahman, {Kazi Sajedur} and Md Akhtaruzzaman and Huda Abdullah and Tiong, {Sieh Kiong} and Nowshad Amin",
year = "2018",
month = "9",
day = "1",
doi = "10.1088/2053-1591/aad6c6",
language = "English",
volume = "5",
journal = "Materials Research Express",
issn = "2053-1591",
publisher = "IOP Publishing Ltd.",
number = "9",

}

Haque, F, Rahman, KS, Akhtaruzzaman, M, Abdullah, H, Tiong, SK & Amin, N 2018, 'Properties of sputtered ZnS thin films for photovoltaic application', Materials Research Express, vol. 5, no. 9, 096409. https://doi.org/10.1088/2053-1591/aad6c6

Properties of sputtered ZnS thin films for photovoltaic application. / Haque, Faiazul; Rahman, Kazi Sajedur; Akhtaruzzaman, Md; Abdullah, Huda; Tiong, Sieh Kiong; Amin, Nowshad.

In: Materials Research Express, Vol. 5, No. 9, 096409, 01.09.2018.

Research output: Contribution to journalArticle

TY - JOUR

T1 - Properties of sputtered ZnS thin films for photovoltaic application

AU - Haque, Faiazul

AU - Rahman, Kazi Sajedur

AU - Akhtaruzzaman, Md

AU - Abdullah, Huda

AU - Tiong, Sieh Kiong

AU - Amin, Nowshad

PY - 2018/9/1

Y1 - 2018/9/1

N2 - ZnS thin films were deposited on soda lime glass substrates by RF magnetron sputtering technique with the variation in radio-frequency (RF) power. A study on the structural, surface topography, surface morphology, optical and electrical properties of the deposited ZnS thin films was carried out through XRD, AFM, FESEM, UV-vis spectrometry and Hall Effect measurement. Structural determination by XRD method indicated that the films are of polycrystalline nature with a strong preferential orientation along the (111) reflection plane exhibiting a cubic or zinc-blende structure for the films deposited at 60 W and above. The optical properties of the films were ascertained for the photon wavelength ranging from 350 to 900 nm. The bandgap was found in the range of 3.22-3.44 eV. The surface roughness and the morphology of the films were also affected by the RF powers as observed from the AFM and FESEM images.

AB - ZnS thin films were deposited on soda lime glass substrates by RF magnetron sputtering technique with the variation in radio-frequency (RF) power. A study on the structural, surface topography, surface morphology, optical and electrical properties of the deposited ZnS thin films was carried out through XRD, AFM, FESEM, UV-vis spectrometry and Hall Effect measurement. Structural determination by XRD method indicated that the films are of polycrystalline nature with a strong preferential orientation along the (111) reflection plane exhibiting a cubic or zinc-blende structure for the films deposited at 60 W and above. The optical properties of the films were ascertained for the photon wavelength ranging from 350 to 900 nm. The bandgap was found in the range of 3.22-3.44 eV. The surface roughness and the morphology of the films were also affected by the RF powers as observed from the AFM and FESEM images.

UR - http://www.scopus.com/inward/record.url?scp=85052313385&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=85052313385&partnerID=8YFLogxK

U2 - 10.1088/2053-1591/aad6c6

DO - 10.1088/2053-1591/aad6c6

M3 - Article

VL - 5

JO - Materials Research Express

JF - Materials Research Express

SN - 2053-1591

IS - 9

M1 - 096409

ER -