Power quality event characterization

Chia Kwang Tan, Vigna Kumaran Ramachandaramurthy, F. M. Siam, A. M. Busrah

Research output: Chapter in Book/Report/Conference proceedingConference contribution

5 Citations (Scopus)

Abstract

This paper presents an algorithm to characterize power quality (PQ) events. Any power quality event captured at the monitoring point will be analyzed automatically in three stages. The first stage differentiates between sag, swell or transient events by using wavelet analysis as well as time domain analysis for counter checking purposes. Any sag events will automatically be passed to second stage to identify if the sag is caused by induction motor starting, transformer energizing or line faults. Important parameters such as phase angle shift, non/symmetrical sag, non/rectangular sag and sag duration are extracted and used for event characterization in the second stage. If a line fault is identified in the second stage, pseudo-measurement and transformer modeling will be executed to identify the fault location together with the 3-phase bus voltages at the faulted point. Here, the third stage is triggered and the line fault is further characterized into single line-to- ground fault, line-to-line fault or double line-to-ground fault by using the zero sequence voltage magnitude as well as zero sequence voltage angle. This automated event characterization algorithm provides a fast identification of areas that are prone to certain types of faults, which leads to much easier identification of causes of faults in that area - such as trees, animals, nature and etc. Preventive measures as well as the correct mitigation option can then be designed to reduce such incidences and thus improves power quality.

Original languageEnglish
Title of host publication4th IET International Conference on Power Electronics, Machines and Drives, PEMD 2008
Pages543-547
Number of pages5
Edition538 CP
DOIs
Publication statusPublished - 01 Dec 2008
Event4th IET International Conference on Power Electronics, Machines and Drives, PEMD 2008 - York, United Kingdom
Duration: 02 Apr 200804 Apr 2008

Other

Other4th IET International Conference on Power Electronics, Machines and Drives, PEMD 2008
CountryUnited Kingdom
CityYork
Period02/04/0804/04/08

Fingerprint

Power quality
Electric potential
Time domain analysis
Electric fault location
Wavelet analysis
Induction motors
Animals
Monitoring

All Science Journal Classification (ASJC) codes

  • Electrical and Electronic Engineering

Cite this

Tan, C. K., Ramachandaramurthy, V. K., Siam, F. M., & Busrah, A. M. (2008). Power quality event characterization. In 4th IET International Conference on Power Electronics, Machines and Drives, PEMD 2008 (538 CP ed., pp. 543-547) https://doi.org/10.1049/cp:20080580
Tan, Chia Kwang ; Ramachandaramurthy, Vigna Kumaran ; Siam, F. M. ; Busrah, A. M. / Power quality event characterization. 4th IET International Conference on Power Electronics, Machines and Drives, PEMD 2008. 538 CP. ed. 2008. pp. 543-547
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Tan, CK, Ramachandaramurthy, VK, Siam, FM & Busrah, AM 2008, Power quality event characterization. in 4th IET International Conference on Power Electronics, Machines and Drives, PEMD 2008. 538 CP edn, pp. 543-547, 4th IET International Conference on Power Electronics, Machines and Drives, PEMD 2008, York, United Kingdom, 02/04/08. https://doi.org/10.1049/cp:20080580

Power quality event characterization. / Tan, Chia Kwang; Ramachandaramurthy, Vigna Kumaran; Siam, F. M.; Busrah, A. M.

4th IET International Conference on Power Electronics, Machines and Drives, PEMD 2008. 538 CP. ed. 2008. p. 543-547.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

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AB - This paper presents an algorithm to characterize power quality (PQ) events. Any power quality event captured at the monitoring point will be analyzed automatically in three stages. The first stage differentiates between sag, swell or transient events by using wavelet analysis as well as time domain analysis for counter checking purposes. Any sag events will automatically be passed to second stage to identify if the sag is caused by induction motor starting, transformer energizing or line faults. Important parameters such as phase angle shift, non/symmetrical sag, non/rectangular sag and sag duration are extracted and used for event characterization in the second stage. If a line fault is identified in the second stage, pseudo-measurement and transformer modeling will be executed to identify the fault location together with the 3-phase bus voltages at the faulted point. Here, the third stage is triggered and the line fault is further characterized into single line-to- ground fault, line-to-line fault or double line-to-ground fault by using the zero sequence voltage magnitude as well as zero sequence voltage angle. This automated event characterization algorithm provides a fast identification of areas that are prone to certain types of faults, which leads to much easier identification of causes of faults in that area - such as trees, animals, nature and etc. Preventive measures as well as the correct mitigation option can then be designed to reduce such incidences and thus improves power quality.

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Tan CK, Ramachandaramurthy VK, Siam FM, Busrah AM. Power quality event characterization. In 4th IET International Conference on Power Electronics, Machines and Drives, PEMD 2008. 538 CP ed. 2008. p. 543-547 https://doi.org/10.1049/cp:20080580