Phase-resolved measurement and modelling of electroluminescence phenomenon in polyethylene subjected to high electrical stress

A. Mohd Ariffin, P. L. Lewin

Research output: Chapter in Book/Report/Conference proceedingConference contribution

5 Citations (Scopus)

Abstract

Electroluminescence (EL) has been widely used as a probe to study early electrical ageing in high voltage cable insulation systems since it can be associated with the energy dissipation of mobile and trapped charges in the molecules of the dielectric medium. In addition to that, the study of charge injection and recombination mechanisms at the metal-polymer interface can also be deduced via EL observations. This paper presents a series of measurements undertaken at Southampton to observe the occurrence of EL with respect to the alternating electrical stress in order to gain a better understanding on the processes responsible for light emission. Attempts have also been made to simulate this phenomenon using a simple approach relating the charge injection and recombination mechanisms within a polymeric material.

Original languageEnglish
Title of host publicationProceedings of 2008 International Conference on Condition Monitoring and Diagnosis, CMD 2008
PublisherIEEE Computer Society
Pages264-267
Number of pages4
ISBN (Print)9781424416219
DOIs
Publication statusPublished - 01 Jan 2008
Event2008 International Conference on Condition Monitoring and Diagnosis, CMD 2008 - Beijing, China
Duration: 21 Apr 200824 Apr 2008

Publication series

NameProceedings of 2008 International Conference on Condition Monitoring and Diagnosis, CMD 2008

Other

Other2008 International Conference on Condition Monitoring and Diagnosis, CMD 2008
CountryChina
CityBeijing
Period21/04/0824/04/08

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All Science Journal Classification (ASJC) codes

  • Industrial and Manufacturing Engineering
  • Safety, Risk, Reliability and Quality

Cite this

Mohd Ariffin, A., & Lewin, P. L. (2008). Phase-resolved measurement and modelling of electroluminescence phenomenon in polyethylene subjected to high electrical stress. In Proceedings of 2008 International Conference on Condition Monitoring and Diagnosis, CMD 2008 (pp. 264-267). [4580277] (Proceedings of 2008 International Conference on Condition Monitoring and Diagnosis, CMD 2008). IEEE Computer Society. https://doi.org/10.1109/CMD.2008.4580277