Pb-free BGA solder joint reliability improvement with Sn3.5Ag solder alloy on Ni/Au finish

Eu Poh Leng, Min Ding, Wayne Lindsay, Sheila Chopin, Ibrahim Ahmad, Azman Jalar

Research output: Chapter in Book/Report/Conference proceedingConference contribution

5 Citations (Scopus)

Abstract

In this work, Sn3.5Ag solder alloy was being studied for the purpose of Pb-free solder joint reliability improvement over conventional Sn3.8Ag0.7Cu solder balls on Ball Grid Array (BGA) packages with Ni/Au pad finishing. The study was carried out in different levels. At individual solder joint level, Sn3.5Ag showed no intermetallic brittle failure in cold ball pull test even upto 6x multiple reflow and 168hrs high temperature storage for TBGA & TePBGA, and 504hrs high temperature storage for PBGA Spanish Oak. In contrast, 70-100% of the failure mode of SAC387 was brittle failure. At package level, Sn3.5Ag survived 8-1 Ox more drop cycles than SAC387 in tray drop and packing drop tests. These results indicate that the mechanical strength of Sn3.5Ag on Ni/Au pad is considerably stronger than that of SAC387. The difference in mechanical strength between the two alloys was correlated to their microstructures. At the same time, board level solder joint reliability tests such as thermal cycling and mechanical bend test were carried out. Sn3.5Ag showed better or similar performance as SAC387.

Original languageEnglish
Title of host publication32nd IEEE International Electronics Manufacturing Technology Symposium, IEMT
Pages243-250
Number of pages8
DOIs
Publication statusPublished - 01 Dec 2007
Event32nd IEEE International Electronics Manufacturing Technology Symposium, IEMT - San Jose, CA, United States
Duration: 03 Oct 200705 Oct 2007

Other

Other32nd IEEE International Electronics Manufacturing Technology Symposium, IEMT
CountryUnited States
CitySan Jose, CA
Period03/10/0705/10/07

Fingerprint

Ball grid arrays
Soldering alloys
Strength of materials
Thermal cycling
Failure modes
Intermetallics
Temperature
Microstructure

All Science Journal Classification (ASJC) codes

  • Industrial and Manufacturing Engineering
  • Electrical and Electronic Engineering

Cite this

Leng, E. P., Ding, M., Lindsay, W., Chopin, S., Ahmad, I., & Jalar, A. (2007). Pb-free BGA solder joint reliability improvement with Sn3.5Ag solder alloy on Ni/Au finish. In 32nd IEEE International Electronics Manufacturing Technology Symposium, IEMT (pp. 243-250). [4417071] https://doi.org/10.1109/IEMT.2007.4417071
Leng, Eu Poh ; Ding, Min ; Lindsay, Wayne ; Chopin, Sheila ; Ahmad, Ibrahim ; Jalar, Azman. / Pb-free BGA solder joint reliability improvement with Sn3.5Ag solder alloy on Ni/Au finish. 32nd IEEE International Electronics Manufacturing Technology Symposium, IEMT. 2007. pp. 243-250
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Leng, EP, Ding, M, Lindsay, W, Chopin, S, Ahmad, I & Jalar, A 2007, Pb-free BGA solder joint reliability improvement with Sn3.5Ag solder alloy on Ni/Au finish. in 32nd IEEE International Electronics Manufacturing Technology Symposium, IEMT., 4417071, pp. 243-250, 32nd IEEE International Electronics Manufacturing Technology Symposium, IEMT, San Jose, CA, United States, 03/10/07. https://doi.org/10.1109/IEMT.2007.4417071

Pb-free BGA solder joint reliability improvement with Sn3.5Ag solder alloy on Ni/Au finish. / Leng, Eu Poh; Ding, Min; Lindsay, Wayne; Chopin, Sheila; Ahmad, Ibrahim; Jalar, Azman.

32nd IEEE International Electronics Manufacturing Technology Symposium, IEMT. 2007. p. 243-250 4417071.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

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Leng EP, Ding M, Lindsay W, Chopin S, Ahmad I, Jalar A. Pb-free BGA solder joint reliability improvement with Sn3.5Ag solder alloy on Ni/Au finish. In 32nd IEEE International Electronics Manufacturing Technology Symposium, IEMT. 2007. p. 243-250. 4417071 https://doi.org/10.1109/IEMT.2007.4417071