MATLAB based image analysis software for characterization of microstructure materials

Aini Hussain, Anuar Mikdad Muad, Ibrahim Ahmad, Che Husna Azhari

Research output: Chapter in Book/Report/Conference proceedingConference contribution

5 Citations (Scopus)

Abstract

This paper presents MATLAB based image analysis software specially developed to perform characteristic analysis of microstructures images such as the Atomic Force Microscopy (AFM), Transmission Electron Microscopy (TEM), Scanning Electron Microscopy (SEM) etc. The developed software is user-friendly with graphical user interface (GUI), allows dynamic 2D and 3D visualization and performs standard statistical analysis to analyze the microstructure morphology automatically. Two examples are given to show the effectiveness of the software.

Original languageEnglish
Title of host publicationICSE 2002 - 2002 IEEE International Conference on Semiconductor Electronics, Proceedings
Pages500-504
Number of pages5
Publication statusPublished - 01 Dec 2002
Event2002 5th IEEE International Conference on Semiconductor Electronics, ICSE 2002 - Penang, Malaysia
Duration: 19 Dec 200221 Dec 2002

Publication series

NameIEEE International Conference on Semiconductor Electronics, Proceedings, ICSE

Other

Other2002 5th IEEE International Conference on Semiconductor Electronics, ICSE 2002
CountryMalaysia
CityPenang
Period19/12/0221/12/02

    Fingerprint

All Science Journal Classification (ASJC) codes

  • Electrical and Electronic Engineering
  • Electronic, Optical and Magnetic Materials

Cite this

Hussain, A., Muad, A. M., Ahmad, I., & Azhari, C. H. (2002). MATLAB based image analysis software for characterization of microstructure materials. In ICSE 2002 - 2002 IEEE International Conference on Semiconductor Electronics, Proceedings (pp. 500-504). [1217873] (IEEE International Conference on Semiconductor Electronics, Proceedings, ICSE).