Electrical stability of PLEDs

Boon Kar Yap, Donal Bradley

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

We report the impact of inserting a 10 nm thickness interlayer between the poly(3,4-ethylenedioxythiophene):poly(styrenesulphonate) (PEDOT:PSS) and light-emitting layers on degradation, in particular the electrical stability of the injecting electrodes, in encapsulated polymer light emitting diodes (PLEDs). Continuous electrical stress testing is carried out to study the time evolution of dark injection hole transients for devices with and without a poly [2,7-(9,9-di-n-octylfluorene)-alt-(1,4-phenylene-((4-secbutylphenyl)imino)-1, 4-phenylene)] (TFB) interlayer. A Sumitomo Chemical Company dibenzothiophene phenylenediamine copolymer (SC002) was used as light emitting layer and PLED characteristics with and without the interlayer are discussed together with lifetime data.

Original languageEnglish
Title of host publication2010 International Conference on Enabling Science and Nanotechnology, ESciNano 2010 - Proceedings
DOIs
Publication statusPublished - 01 Dec 2010
Event2010 International Conference on Enabling Science and Nanotechnology, ESciNano 2010 - Kuala Lumpur, Malaysia
Duration: 01 Dec 201003 Dec 2010

Other

Other2010 International Conference on Enabling Science and Nanotechnology, ESciNano 2010
CountryMalaysia
CityKuala Lumpur
Period01/12/1003/12/10

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All Science Journal Classification (ASJC) codes

  • Biotechnology

Cite this

Yap, B. K., & Bradley, D. (2010). Electrical stability of PLEDs. In 2010 International Conference on Enabling Science and Nanotechnology, ESciNano 2010 - Proceedings [5700945] https://doi.org/10.1109/ESCINANO.2010.5700945