Dynamic calibration and performance of reliable and fast-response coaxial temperature probes in a shock tube facility

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An experimental dynamic calibration technique of reliable, rugged, low-cost, and fast-response coaxial temperature probes is presented. These probes were successfully designed and fabricated in-house, in conjunction with its signal processing circuit, which can be used for transient heat transfer measurements in a hypersonic testing facility. These probes have a response time less than 50 μs with a rise time less than 0.3 μs. Two types of scratches were used, mainly abrasive papers with different grit sizes and scalpel blades with different thicknesses to form the probe junction. The effect of the scratch technique on the probe's thermal product is investigated. The probes were tested and calibrated in the test section and end wall of the UNITEN shock tube facility at different axial and radial locations. The effects of placing the coaxial temperature probe at different axial and radial distances, different working fluids, and different Mach numbers on the transient surface temperature rise were examined. It was observed from the dynamic calibration results that the thermal product of a particular coaxial temperature probe depends on Mach number, junction scratch technique, and junction location, as well as on the enthalpy conditions. It was also noticed that the calibrated coaxial temperature probe using the scalpel blade technique with a particular blade size gives consistent thermal product values. Thus, it does not require an individual calibration. However, for a coaxial temperature probe whose junction was created using the abrasive paper technique with different grit sizes, a calibration for each coaxial temperature probe is likely to be needed.

Original languageEnglish
Pages (from-to)109-132
Number of pages24
JournalExperimental Heat Transfer
Issue number2
Publication statusPublished - 01 Apr 2011


All Science Journal Classification (ASJC) codes

  • Control and Systems Engineering
  • Instrumentation
  • Electrical and Electronic Engineering

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