Direct measurement of the complex refractive index in the extreme ultraviolet spectral region using diffraction from a nanosphere array

B. Mills, C. F. Chau, E. T.F. Rogers, J. Grant-Jacob, S. L. Stebbings, M. Praeger, A. M. De Paula, C. A. Froud, R. T. Chapman, T. J. Butcher, J. J. Baumberg, W. S. Brocklesby, J. G. Frey

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Abstract

Using extreme ultraviolet (XUV) radiation from a high harmonic source, we observe diffraction from a single-layer self-assembled hexagonal array of 196±1.2 nm diameter polystyrene spheres. The Mie solution is used to predict the correct form factor for a single sphere and hence model the intensities of the observed diffraction peaks for the first three orders. By measuring the diffraction intensities in this way, we demonstrate a technique for obtaining the complex refractive index of a material at multiple wavelengths in the XUV from a single measurement. We present experimental results for polystyrene in the range of 25-30 nm.

Original languageEnglish
Article number231103
JournalApplied Physics Letters
Volume93
Issue number23
DOIs
Publication statusPublished - 19 Dec 2008

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All Science Journal Classification (ASJC) codes

  • Physics and Astronomy (miscellaneous)

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