Direct measurement of the complex refractive index in the extreme ultraviolet spectral region using diffraction from a nanosphere array

B. Mills, C. F. Chau, E. T.F. Rogers, J. Grant-Jacob, S. L. Stebbings, M. Praeger, A. M. De Paula, C. A. Froud, R. T. Chapman, T. J. Butcher, J. J. Baumberg, W. S. Brocklesby, J. G. Frey

Research output: Contribution to journalArticle

6 Citations (Scopus)

Abstract

Using extreme ultraviolet (XUV) radiation from a high harmonic source, we observe diffraction from a single-layer self-assembled hexagonal array of 196±1.2 nm diameter polystyrene spheres. The Mie solution is used to predict the correct form factor for a single sphere and hence model the intensities of the observed diffraction peaks for the first three orders. By measuring the diffraction intensities in this way, we demonstrate a technique for obtaining the complex refractive index of a material at multiple wavelengths in the XUV from a single measurement. We present experimental results for polystyrene in the range of 25-30 nm.

Original languageEnglish
Article number231103
JournalApplied Physics Letters
Volume93
Issue number23
DOIs
Publication statusPublished - 19 Dec 2008

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refractivity
polystyrene
diffraction
extreme ultraviolet radiation
form factors
harmonics
wavelengths

All Science Journal Classification (ASJC) codes

  • Physics and Astronomy (miscellaneous)

Cite this

Mills, B. ; Chau, C. F. ; Rogers, E. T.F. ; Grant-Jacob, J. ; Stebbings, S. L. ; Praeger, M. ; De Paula, A. M. ; Froud, C. A. ; Chapman, R. T. ; Butcher, T. J. ; Baumberg, J. J. ; Brocklesby, W. S. ; Frey, J. G. / Direct measurement of the complex refractive index in the extreme ultraviolet spectral region using diffraction from a nanosphere array. In: Applied Physics Letters. 2008 ; Vol. 93, No. 23.
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abstract = "Using extreme ultraviolet (XUV) radiation from a high harmonic source, we observe diffraction from a single-layer self-assembled hexagonal array of 196±1.2 nm diameter polystyrene spheres. The Mie solution is used to predict the correct form factor for a single sphere and hence model the intensities of the observed diffraction peaks for the first three orders. By measuring the diffraction intensities in this way, we demonstrate a technique for obtaining the complex refractive index of a material at multiple wavelengths in the XUV from a single measurement. We present experimental results for polystyrene in the range of 25-30 nm.",
author = "B. Mills and Chau, {C. F.} and Rogers, {E. T.F.} and J. Grant-Jacob and Stebbings, {S. L.} and M. Praeger and {De Paula}, {A. M.} and Froud, {C. A.} and Chapman, {R. T.} and Butcher, {T. J.} and Baumberg, {J. J.} and Brocklesby, {W. S.} and Frey, {J. G.}",
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Mills, B, Chau, CF, Rogers, ETF, Grant-Jacob, J, Stebbings, SL, Praeger, M, De Paula, AM, Froud, CA, Chapman, RT, Butcher, TJ, Baumberg, JJ, Brocklesby, WS & Frey, JG 2008, 'Direct measurement of the complex refractive index in the extreme ultraviolet spectral region using diffraction from a nanosphere array', Applied Physics Letters, vol. 93, no. 23, 231103. https://doi.org/10.1063/1.3033549

Direct measurement of the complex refractive index in the extreme ultraviolet spectral region using diffraction from a nanosphere array. / Mills, B.; Chau, C. F.; Rogers, E. T.F.; Grant-Jacob, J.; Stebbings, S. L.; Praeger, M.; De Paula, A. M.; Froud, C. A.; Chapman, R. T.; Butcher, T. J.; Baumberg, J. J.; Brocklesby, W. S.; Frey, J. G.

In: Applied Physics Letters, Vol. 93, No. 23, 231103, 19.12.2008.

Research output: Contribution to journalArticle

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AU - Mills, B.

AU - Chau, C. F.

AU - Rogers, E. T.F.

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AU - Stebbings, S. L.

AU - Praeger, M.

AU - De Paula, A. M.

AU - Froud, C. A.

AU - Chapman, R. T.

AU - Butcher, T. J.

AU - Baumberg, J. J.

AU - Brocklesby, W. S.

AU - Frey, J. G.

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