Dielectric verification of FR4 substrate using microstrip bandstop resonator and CAE tool

Chin Hock Goh, Chandan Kumar Chakrabarty, Emilliano, Mohammad Hadi Badjian

Research output: Chapter in Book/Report/Conference proceedingConference contribution

4 Citations (Scopus)

Abstract

This paper describes a method to determine the dielectric constant of FR4 substrate material at the operating frequency of 2.3 GHz. The method make used of computer aided engineering (CAE) tool and microstrip bandstop resonator for investigating the dielectric value of a material. In accordance with the data sheet provided by manufacturer which is 4.5 at 10 MHz, a set of preliminary dielectric values are selected in order to explain the proposed technique. Microstrip bandstop resonators with different dimension are designed and analyzed with the electromagnetic simulator. They are fabricated using conventional wet-etching process which is relatively economical compared to other method. After that, the actual responses of the square ring resonators are measured with the vector network analyzer. By matching up the simulation results to the measured results, dielectric values selected earlier are tuned accordingly. The obtained values are used to validate the accuracy of the proposed method. The method is simple to practice. It provides the beginners a fast way and relatively straightforward method in investigating FR4 materials for their research and learning.

Original languageEnglish
Title of host publicationProceedings - MICC 2009
Subtitle of host publication2009 IEEE 9th Malaysia International Conference on Communications with a Special Workshop on Digital TV Contents
Pages894-898
Number of pages5
DOIs
Publication statusPublished - 2009
Event2009 IEEE 9th Malaysia International Conference on Communications with a Special Workshop on Digital TV Contents, MICC 2009 - Kuala Lumpur, Malaysia
Duration: 15 Dec 200917 Dec 2009

Other

Other2009 IEEE 9th Malaysia International Conference on Communications with a Special Workshop on Digital TV Contents, MICC 2009
CountryMalaysia
CityKuala Lumpur
Period15/12/0917/12/09

Fingerprint

Computer aided engineering
Resonators
engineering
Substrates
Electric network analyzers
Wet etching
Values
Permittivity
Simulators
simulation
learning

All Science Journal Classification (ASJC) codes

  • Computer Networks and Communications
  • Communication

Cite this

Goh, C. H., Kumar Chakrabarty, C., Emilliano, & Badjian, M. H. (2009). Dielectric verification of FR4 substrate using microstrip bandstop resonator and CAE tool. In Proceedings - MICC 2009: 2009 IEEE 9th Malaysia International Conference on Communications with a Special Workshop on Digital TV Contents (pp. 894-898). [5431459] https://doi.org/10.1109/MICC.2009.5431459
Goh, Chin Hock ; Kumar Chakrabarty, Chandan ; Emilliano ; Badjian, Mohammad Hadi. / Dielectric verification of FR4 substrate using microstrip bandstop resonator and CAE tool. Proceedings - MICC 2009: 2009 IEEE 9th Malaysia International Conference on Communications with a Special Workshop on Digital TV Contents. 2009. pp. 894-898
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Goh, CH, Kumar Chakrabarty, C, Emilliano & Badjian, MH 2009, Dielectric verification of FR4 substrate using microstrip bandstop resonator and CAE tool. in Proceedings - MICC 2009: 2009 IEEE 9th Malaysia International Conference on Communications with a Special Workshop on Digital TV Contents., 5431459, pp. 894-898, 2009 IEEE 9th Malaysia International Conference on Communications with a Special Workshop on Digital TV Contents, MICC 2009, Kuala Lumpur, Malaysia, 15/12/09. https://doi.org/10.1109/MICC.2009.5431459

Dielectric verification of FR4 substrate using microstrip bandstop resonator and CAE tool. / Goh, Chin Hock; Kumar Chakrabarty, Chandan; Emilliano; Badjian, Mohammad Hadi.

Proceedings - MICC 2009: 2009 IEEE 9th Malaysia International Conference on Communications with a Special Workshop on Digital TV Contents. 2009. p. 894-898 5431459.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

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Goh CH, Kumar Chakrabarty C, Emilliano, Badjian MH. Dielectric verification of FR4 substrate using microstrip bandstop resonator and CAE tool. In Proceedings - MICC 2009: 2009 IEEE 9th Malaysia International Conference on Communications with a Special Workshop on Digital TV Contents. 2009. p. 894-898. 5431459 https://doi.org/10.1109/MICC.2009.5431459