Complex permittivity measurement using capacitance method from 300 kHz to 50 MHz

Wong Jee Keen Raymond, Chandan Kumar Chakrabarty, Chin Hock Goh, Ahmad Basri Ghani

Research output: Contribution to journalArticle

9 Citations (Scopus)

Abstract

Complex permittivity measurement has been performed using a parallel plate capacitor and a vector network analyzer (VNA) from 300 kHz to 50 MHz. The material under test (MUT) is a flat and thin sample clamped between the capacitor plates and connected to the VNA to obtain its two port S parameters. The S parameter is converted into impedance to calculate the complex permittivity using Matlab program. Techniques used to overcome the air gap and stray capacitance was described. Measurement obtained using the proposed method was compared with the free space method to validate its accuracy. The percent difference is less than 5%.

Original languageEnglish
Pages (from-to)3796-3801
Number of pages6
JournalMeasurement: Journal of the International Measurement Confederation
Volume46
Issue number10
DOIs
Publication statusPublished - 01 Jan 2013

Fingerprint

Permittivity measurement
Electric network analyzers
Scattering parameters
Permittivity
Capacitance
Capacitor
analyzers
capacitors
Capacitors
capacitance
permittivity
Free Space
parallel plates
Impedance
Percent
MATLAB
air
impedance
Calculate
Air

All Science Journal Classification (ASJC) codes

  • Instrumentation
  • Electrical and Electronic Engineering

Cite this

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Complex permittivity measurement using capacitance method from 300 kHz to 50 MHz. / Raymond, Wong Jee Keen; Kumar Chakrabarty, Chandan; Goh, Chin Hock; Ghani, Ahmad Basri.

In: Measurement: Journal of the International Measurement Confederation, Vol. 46, No. 10, 01.01.2013, p. 3796-3801.

Research output: Contribution to journalArticle

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