Characterization of a submicron PMOS in mixer circuits

Kim Ho Yeap, Ibrahim Ahmad, Zairi Ismael Rizman, Kerlit Chew, Kok Hen Chong, Yun Thung Yong

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Citations (Scopus)

Abstract

In this paper, we investigate the properties of a sub micron pMOS with a single layer of metallization. The fabrication process and electrical characterization of the device were simulated using the SILVACO TCAD tools. We have applied constant field scaling on the effective channel length, the density of ion implantation for threshold voltage adjustment, and gate oxide thickness. To suppress short channel effects, we have also applied retrograde well implantation, Shallow Trench Isolation (STI), sidewall spacer deposition, silicide formation, and Lightly Doped Drain implantation in our process simulation. We have validated the electrical performance of the device by plotting and analyzing the I D - V g relationship.

Original languageEnglish
Title of host publicationIEEE Conference on Sustainable Utilization and Development in Engineering and Technology 2010, STUDENT 2010 - Conference Booklet
Pages123-126
Number of pages4
DOIs
Publication statusPublished - 01 Dec 2010
EventIEEE Conference on Sustainable Utilization and Development in Engineering and Technology 2010, STUDENT 2010 - Kuala Lumpur, Malaysia
Duration: 20 Nov 201021 Nov 2010

Publication series

NameIEEE Conference on Sustainable Utilization and Development in Engineering and Technology 2010, STUDENT 2010 - Conference Booklet

Other

OtherIEEE Conference on Sustainable Utilization and Development in Engineering and Technology 2010, STUDENT 2010
CountryMalaysia
CityKuala Lumpur
Period20/11/1021/11/10

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All Science Journal Classification (ASJC) codes

  • Renewable Energy, Sustainability and the Environment

Cite this

Yeap, K. H., Ahmad, I., Rizman, Z. I., Chew, K., Chong, K. H., & Yong, Y. T. (2010). Characterization of a submicron PMOS in mixer circuits. In IEEE Conference on Sustainable Utilization and Development in Engineering and Technology 2010, STUDENT 2010 - Conference Booklet (pp. 123-126). [5686992] (IEEE Conference on Sustainable Utilization and Development in Engineering and Technology 2010, STUDENT 2010 - Conference Booklet). https://doi.org/10.1109/STUDENT.2010.5686992