• 663 Citations
  • 13 h-Index
19982020

Research output per year

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Research Output

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Conference contribution
2018

Jsc and Voc optimization of perovskite solar cell with interface defect layer using taguchi method

Bahrudin, M. S., Abdullah, S. F., Ahmad, I., Mahmood Zuhdi, A. W., Hasani, A. H., Za'Abar, F., Malik, M. & Harif, M. N., 03 Oct 2018, 2018 IEEE International Conference on Semiconductor Electronics, ICSE 2018 - Proceedings. Institute of Electrical and Electronics Engineers Inc., p. 192-196 5 p. 8481203. (IEEE International Conference on Semiconductor Electronics, Proceedings, ICSE; vol. 2018-August).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Modeling, simulation and optimization of 14nm high-K/metal gate NMOS with taguchi method

Mah, S. K., Ahmad, I., Ker, P. J., Tan, K. P. & Faizah, Z. A. N., 03 Oct 2018, 2018 IEEE International Conference on Semiconductor Electronics, ICSE 2018 - Proceedings. Institute of Electrical and Electronics Engineers Inc., p. 275-278 4 p. 8481293. (IEEE International Conference on Semiconductor Electronics, Proceedings, ICSE; vol. 2018-August).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)
2016

Modeling and simulation of InAs photodiode on electric field profile and dark current characteristics

Roslan, P. S. A., Ker, P. J., Ahmad, I., Jagadeesh, P. & Fam, P. Z., 21 Sep 2016, 2016 IEEE International Conference on Semiconductor Electronics, ICSE 2016 - Proceedings. Institute of Electrical and Electronics Engineers Inc., p. 188-191 4 p. 7573623. (IEEE International Conference on Semiconductor Electronics, Proceedings, ICSE; vol. 2016-September).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

3 Citations (Scopus)
2015

Determination of impact damage severity level in Sheet Molding Compound composite material using thermography method - A preliminary study

Mohamed, A. A., Disele, T. L., Ahmad, I. & Mohd, S., 29 Apr 2015, Advancing of Nuclear Science and Energy for National Development: Proceedings of the Nuclear Science, Technology, and Engineering Conference 2014, NuSTEC 2014. Hamzah, K., Idris, F. M., Hasan, A. B. & Mohamed, A. A. (eds.). American Institute of Physics Inc., 040008. (AIP Conference Proceedings; vol. 1659).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Development of process parameters for 22 nm PMOS using 2-D analytical modeling

Maheran, A. H. A., Menon, P. S., Ahmad, I., Shaari, S. & Faizah, Z. A. N., 24 Apr 2015, National Physics Conference 2014, PERFIK 2014. Yong, T-K., Phua, Y-N., Lin, H-S. & Rahman, F. A. (eds.). American Institute of Physics Inc., 030007. (AIP Conference Proceedings; vol. 1657).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Influence of process parameters on threshold voltage and leakage current in 18nm NMOS device

Atan, N., Ahmad, I., Majlis, B. B. Y. & Fauzi, I. B. A., 24 Apr 2015, National Physics Conference 2014, PERFIK 2014. Yong, T-K., Phua, Y-N., Lin, H-S. & Rahman, F. A. (eds.). American Institute of Physics Inc., 110002. (AIP Conference Proceedings; vol. 1657).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Modeling of 14 nm gate length n-Type MOSFET

Faizah, Z. A. N., Ahmad, I., Ker, P. J., Roslan, P. S. A. & Maheran, A. H. A., 11 Dec 2015, RSM 2015 - 2015 IEEE Regional Symposium on Micro and Nano Electronics, Proceedings. Institute of Electrical and Electronics Engineers Inc., 7354988. (RSM 2015 - 2015 IEEE Regional Symposium on Micro and Nano Electronics, Proceedings).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

8 Citations (Scopus)

Statistical optimization of process parameters for threshold voltage in 22 nm p-Type MOSFET using Taguchi method

Maheran, A. H. A., Menon, P. S., Shaari, S., Ahmad, I. & Faizah, Z. A. N., 11 Dec 2015, RSM 2015 - 2015 IEEE Regional Symposium on Micro and Nano Electronics, Proceedings. Institute of Electrical and Electronics Engineers Inc., 7354989. (RSM 2015 - 2015 IEEE Regional Symposium on Micro and Nano Electronics, Proceedings).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2014

Analysis of threshold voltage variance in 45nm n-channel device using L27 orthogonal array method

Salehuddin, F., Mohd Zain, A. S., Idris, N. M., Mat Yamin, A. K., Abdul Hamid, A. M., Ahmad, I. & Menon, P. S., 2014, Manufacturing Engineering. p. 297-302 6 p. (Advanced Materials Research; vol. 903).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

9 Citations (Scopus)

Application of Taguchi method in designing a 22nm high-k/metal gate NMOS transistor

Afifah Maheran, A. H., Menon, P. S., Ahmad, I. & Shaari, S., 01 Jan 2014, Micro/Nano Science and Engineering. Trans Tech Publications, p. 514-518 5 p. (Advanced Materials Research; vol. 925).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Effect of process parameter variability on the threshold voltage of downscaled 22nm PMOS using taguchi method

Maheran, A. H. A., Menon, P. S., Shaari, S., Kalaivani, T., Ahmad, I., Faizah, Z. A. N. & Apte, P. R., 10 Oct 2014, IEEE International Conference on Semiconductor Electronics, Proceedings, ICSE. Institute of Electrical and Electronics Engineers Inc., p. 178-181 4 p. 6920825

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Effects of high-K dielectrics with metal gate for electrical characteristics of 18nm NMOS device

Atan, N., Ahmad, I. & Majlis, B. B. Y., 10 Oct 2014, IEEE International Conference on Semiconductor Electronics, Proceedings, ICSE. Institute of Electrical and Electronics Engineers Inc., p. 56-59 4 p. 6920794

Research output: Chapter in Book/Report/Conference proceedingConference contribution

13 Citations (Scopus)

Statistical process modelling for 32nm high-K/metal gate PMOS device

Maheran, A. H. A., Noor Faizah, Z. A., Menon, P. S., Ahmad, I., Apte, P. R., Kalaivani, T. & Salehuddin, F., 10 Oct 2014, IEEE International Conference on Semiconductor Electronics, Proceedings, ICSE. Institute of Electrical and Electronics Engineers Inc., p. 232-235 4 p. 6920839. (IEEE International Conference on Semiconductor Electronics, Proceedings, ICSE).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

7 Citations (Scopus)

Taguchi optimization of a SiGe/Si quantum dot SOI-based lateral PIN photodiode

Menon, P. S., Tasirin, S. K., Ahmad, I. & Abdullah, S. F., 01 Jan 2014, Micro/Nano Science and Engineering. Trans Tech Publications, p. 646-650 5 p. (Advanced Materials Research; vol. 925).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)
2013

Responsivity optimization of a MQW SOI-based lateral PIN photodiode using Taguchi's L27 orthogonal array

Menon, P. S., Tasirin, S. K., Ahmad, I., Abdullah, S. F. & Apte, P. R., 01 Dec 2013, Proceedings - RSM 2013: 2013 IEEE Regional Symposium on Micro and Nano Electronics. p. 254-257 4 p. 6706523. (Proceedings - RSM 2013: 2013 IEEE Regional Symposium on Micro and Nano Electronics).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Citations (Scopus)

Threshold voltage optimization in a 22nm High-k/Salicide PMOS device

Afifah Maheran, A. H., Menon, P. S., Ahmad, I. & Yusoff, Z., 01 Dec 2013, Proceedings - RSM 2013: 2013 IEEE Regional Symposium on Micro and Nano Electronics. p. 126-129 4 p. 6706489. (Proceedings - RSM 2013: 2013 IEEE Regional Symposium on Micro and Nano Electronics).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

3 Citations (Scopus)
2012

High performance of a SOI-based lateral PIN photodiode using SiGe/Si multilayer quantum well

Menon, P. S., Tasirin, S. K., Ahmad, I. & Abdullah, S. F., 2012, 2012 10th IEEE International Conference on Semiconductor Electronics, ICSE 2012 - Proceedings. p. 403-406 4 p. 6417172

Research output: Chapter in Book/Report/Conference proceedingConference contribution

3 Citations (Scopus)

Impact of different dose and angle in HALO structure for 45nm NMOS device

Salehuddin, F., Ahmad, I., Hamid, F. A. & Zaharim, A., 01 Jan 2012, Manufacturing Science and Technology. p. 6827-6833 7 p. (Advanced Materials Research; vol. 383-390).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

8 Citations (Scopus)

Modeling and optimizing of threshold voltage of 32nm NMOS transistor using L18 orthogonal array Taguchi method

Elgomati, H. A., Majlis, B. Y. & Ahmad, I., 01 Dec 2012, International Conference on Fundamental and Applied Sciences 2012, ICFAS 2012. Vol. 1482. p. 543-549 7 p.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Modelling of process parameters for 32nm PMOS transistor using Taguchi method

Elgomati, H. A., Majlis, B. Y., Hamid, A. M. A., Susthitha, P. M. & Ahmad, I., 27 Sep 2012, Proceedings - 6th Asia International Conference on Mathematical Modelling and Computer Simulation, AMS 2012. p. 40-45 6 p. 6243918

Research output: Chapter in Book/Report/Conference proceedingConference contribution

14 Citations (Scopus)

Morphology and optical properties of nickel oxide nanostructure from aqueous solution

Hamid, M. A. A., Bakar, M. A., Jalar, A., Shamsudin, R. & Ahmad, I., 01 Jan 2012, New Materials, Applications and Processes. p. 581-584 4 p. (Advanced Materials Research; vol. 399-401).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

3 Citations (Scopus)

Optimization of process parameter variation in 45nm p-channel MOSFET using L18 orthogonal array

Salehuddin, F., Ahmad, I., Hamid, F. A., Zaharim, A., Hamid, A. M. A., Menon, P. S., Elgomati, H. A., Majlis, B. Y. & Apte, P. R., 01 Dec 2012, 2012 10th IEEE International Conference on Semiconductor Electronics, ICSE 2012 - Proceedings. p. 219-223 5 p. 6417127

Research output: Chapter in Book/Report/Conference proceedingConference contribution

4 Citations (Scopus)

Scaling down of the 32 nm to 22 nm gate length NMOS transistor

Afifah Maheran, A. H., Menon, P. S., Ahmad, I., Elgomati, H. A., Majlis, B. Y. & Salehuddin, F., 2012, 2012 10th IEEE International Conference on Semiconductor Electronics, ICSE 2012 - Proceedings. p. 173-176 4 p. 6417117

Research output: Chapter in Book/Report/Conference proceedingConference contribution

10 Citations (Scopus)

Statistical modeling of solar cell using Taguchi method and TCAD tool

Bahrudin, M. S., Abdullah, S. F. & Ahmad, I., 01 Dec 2012, 2012 10th IEEE International Conference on Semiconductor Electronics, ICSE 2012 - Proceedings. p. 1-5 5 p. 6417073. (2012 10th IEEE International Conference on Semiconductor Electronics, ICSE 2012 - Proceedings).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

3 Citations (Scopus)

Technique to improve visibility for cycle time improvement in semiconductor manufacturing

Rahim, S. R. A., Ahmad, I. & Chik, M. A., 01 Dec 2012, 2012 10th IEEE International Conference on Semiconductor Electronics, ICSE 2012 - Proceedings. p. 627-630 4 p. 6417223. (2012 10th IEEE International Conference on Semiconductor Electronics, ICSE 2012 - Proceedings).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

7 Citations (Scopus)
2011

Analyze of input process parameter variation on threshold voltage in 45nm n-channel MOSFET

Salehuddin, F., Ahmad, I., Hamid, F. A., Zaharim, A., Elgomati, H. A. & Majlis, B. Y., 22 Dec 2011, 2011 IEEE Regional Symposium on Micro and Nanoelectronics, RSM 2011 - Programme and Abstracts. p. 70-74 5 p. 6088294. (2011 IEEE Regional Symposium on Micro and Nanoelectronics, RSM 2011 - Programme and Abstracts).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

5 Citations (Scopus)

Cobalt silicide and titanium silicide effects on nano devices

Elgomati, H. A., Majlis, B. Y., Salehuddin, F., Ahmad, I., Zaharim, A. & Hamid, F. A., 2011, 2011 IEEE Regional Symposium on Micro and Nanoelectronics, RSM 2011 - Programme and Abstracts. p. 282-285 4 p. 6088344

Research output: Chapter in Book/Report/Conference proceedingConference contribution

5 Citations (Scopus)

Nanoindentation characterization of Sn-Ag-Sb/Cu substrate IMC Layer subject to thermal aging

Shualdi, W., Bais, B., Ahmad, I., Omar, G. & Isnin, A., 22 Dec 2011, 2011 IEEE Regional Symposium on Micro and Nanoelectronics, RSM 2011 - Programme and Abstracts. p. 220-223 4 p. 6088328. (2011 IEEE Regional Symposium on Micro and Nanoelectronics, RSM 2011 - Programme and Abstracts).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Optimizing 35nm NMOS devices V TH and I LEAK by controlling active area and halo implantation dosage

Elgomati, H. A., Majlis, B. Y., Salehuddin, F., Ahmad, I., Zaharim, A. & Hamid, F. A., 2011, 2011 IEEE Regional Symposium on Micro and Nanoelectronics, RSM 2011 - Programme and Abstracts. p. 286-290 5 p. 6088345

Research output: Chapter in Book/Report/Conference proceedingConference contribution

6 Citations (Scopus)

Throughput improvement in semiconductor fabrication for 0.13μm technology

Balakrishna, P., Chik, M. A., Ahmad, I. & Mohamad, B., 22 Dec 2011, 2011 IEEE Regional Symposium on Micro and Nanoelectronics, RSM 2011 - Programme and Abstracts. p. 228-231 4 p. 6088330. (2011 IEEE Regional Symposium on Micro and Nanoelectronics, RSM 2011 - Programme and Abstracts).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

8 Citations (Scopus)
2010

Analyze and optimize the silicide thickness in 45nm CMOS technology using Taguchi method

Salehuddin, F., Ahmad, I., Hamid, F. A. & Zaharim, A., 11 Oct 2010, ICSE 2010 - Proceedings IEEE International Conference on Semiconductor Electronics. p. 19-24 6 p. 5549488. (IEEE International Conference on Semiconductor Electronics, Proceedings, ICSE).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

7 Citations (Scopus)

A study for optimum productivity yield in 0.16μm mixed of wafer fabrication facility

Chik, M. A., Yung, V. C., Balakrishna, P., Hashim, U., Ahmad, I. & Mohamad, B., 11 Oct 2010, ICSE 2010 - Proceedings IEEE International Conference on Semiconductor Electronics. p. 377-380 4 p. 5549356

Research output: Chapter in Book/Report/Conference proceedingConference contribution

5 Citations (Scopus)

Characterization and optimizations of silicide thickness in 45nm pMOS device

Salehuddin, F., Ahmad, I., Hamid, F. A. & Zaharim, A., 11 Aug 2010, 2010 International Conference on Electronic Devices, Systems and Applications, ICEDSA 2010 - Proceedings. p. 300-304 5 p. 5503054. (2010 International Conference on Electronic Devices, Systems and Applications, ICEDSA 2010 - Proceedings).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

3 Citations (Scopus)

Characterization of a submicron PMOS in mixer circuits

Yeap, K. H., Ahmad, I., Rizman, Z. I., Chew, K., Chong, K. H. & Yong, Y. T., 01 Dec 2010, IEEE Conference on Sustainable Utilization and Development in Engineering and Technology 2010, STUDENT 2010 - Conference Booklet. p. 123-126 4 p. 5686992. (IEEE Conference on Sustainable Utilization and Development in Engineering and Technology 2010, STUDENT 2010 - Conference Booklet).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Citations (Scopus)

Characterization of fabrication process noises for 32nm NMOS devices

Elgomati, H. A., Majlis, B. Y., Ahmad, I. & Ziad, T., 11 Oct 2010, ICSE 2010 - Proceedings IEEE International Conference on Semiconductor Electronics. p. 252-255 4 p. 5549581

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Effect of process parameter variations on threshold voltage in 45nm NMOS device

Salehuddin, F., Ahmad, I., Hamid, F. A. & Zaharim, A., 01 Dec 2010, Proceeding, 2010 IEEE Student Conference on Research and Development - Engineering: Innovation and Beyond, SCOReD 2010. p. 334-338 5 p. 5704034. (Proceeding, 2010 IEEE Student Conference on Research and Development - Engineering: Innovation and Beyond, SCOReD 2010).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

5 Citations (Scopus)

Impact of HALO structure on threshold voltage and leakage current in 45nm NMOS device

Salehuddin, F., Ahmad, I., Hamid, F. A. & Zaharim, A., 01 Dec 2010, Proceedings of the 2010 Asia Pacific Conference on Circuit and System, APCCAS 2010. p. 1147-1150 4 p. 5774934. (IEEE Asia-Pacific Conference on Circuits and Systems, Proceedings, APCCAS).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Mechanical properties study of lead free solder joint material used in semiconductor packaging subjected to thermal condition

Harif, M. N. & Ahmad, I., 11 Aug 2010, 2010 International Conference on Electronic Devices, Systems and Applications, ICEDSA 2010 - Proceedings. p. 331-334 4 p. 5503049. (2010 International Conference on Electronic Devices, Systems and Applications, ICEDSA 2010 - Proceedings).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2009

BGA lead-free C5 solder system improvement by germanium addition to Sn3.5Ag and Sn-3.8Ag-0.7Cu solder alloy

Leng, E. P., Ling, W. T., Amin, N., Ahmad, I., Han, T. Y., Chiao, C. W. & Haseeb, A. S. M. A., 2009, EPTC 2009 - Proceedings of 2009 11th Electronic Packaging Technology Conference. p. 82-91 10 p. 5416568

Research output: Chapter in Book/Report/Conference proceedingConference contribution

6 Citations (Scopus)

Effect of Germanium addition to Sn3.5Ag lead free solder system for overall BGA package robustness improvement

Leng, E. P., Ling, W. T., Ding, M., Amin, N., Ahmad, I., Han, T. Y. & Haseeb, A. S. M. A., 2009, Proceedings - 2009 International Symposium on Microelectronics, IMAPS 2009. p. 150-157 8 p.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2008

A comparison study on SnAgNiCo and Sn3.8Ag0.7Cu C5 lead free solder system

Leng, E. P., Ding, M., Ling, W. T., Amin, N., Ahmad, I., Lee, M. Y. & Haseeb, 01 Dec 2008, Proceedings - 2008 International Symposium on Microelectronics, IMAPS 2008. p. 962-969 8 p. (Proceedings - 2008 International Symposium on Microelectronics, IMAPS 2008).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

An efficient first order sigma delta modulator design

Amin, N., Guan, G. C. & Ahmad, I., 2008, IEEE Canadian Conference on Electrical and Computer Engineering, Proceedings, CCECE 2008. p. 29-32 4 p. 4564489

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Citations (Scopus)

An experimental study of defect determination using pulsed thermal non-destructive testing

Umar, M. Z., Ahmad, I., Hamzah, A. R. & Abdullah, W. S. W., 01 Dec 2008, Current Issues of Physics in Malaysia - National Physics Conference 2007, PERFIK 2007. p. 215-219 5 p. (AIP Conference Proceedings; vol. 1017).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

A study of lead-free BGA backward compatibility through solderability testing at component level

Leng, E. P., Ling, W. T., Amin, N. & Ahmad, I., 01 Dec 2008, Proceedings - 2008 International Symposium on Microelectronics, IMAPS 2008. p. 572-578 7 p. (Proceedings - 2008 International Symposium on Microelectronics, IMAPS 2008).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

A study of lead-free BGA backward compatibility through solderability testing at component level

Leng, E. P., Ling, W. T., Amin, N. & Ahmad, I., 01 Dec 2008, 10th Electronics Packaging Technology Conference, EPTC 2008. p. 463-469 7 p. 4763477. (10th Electronics Packaging Technology Conference, EPTC 2008).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

A study of SnAgNiCo vs Sn3.8AgO.7Cu C5 lead free solder alloy on mechanical strength of BGA solder joint

Leng, E. P., Ding, M., Ling, W. T., Amin, N., Ahmad, I., Lee, M. Y. & Haseeb, A. S. M. A., 01 Dec 2008, 10th Electronics Packaging Technology Conference, EPTC 2008. p. 588-594 7 p. 4763497. (10th Electronics Packaging Technology Conference, EPTC 2008).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

11 Citations (Scopus)

Dicing laminated wafer for QFN 3D stacked die packaging

Abdullah, S., Endut, Z., Ahmad, I., Jalar, A. & Yusof, S. M., 01 Jan 2008, Semiconductor Photonics: Nano-Structured Materials and Devices. Trans Tech Publications, p. 202-205 4 p. (Advanced Materials Research; vol. 31).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Effect of treated silver nanoparticles to electrical conductivity improvement of electrically conductive adhesive (ECA)

Kornain, Z., Amin, N., Jalar, A., Cheah, A. Y. & Ahmad, I., 01 Dec 2008, ICSE 2008 Proceedings - 2008 IEEE International Conference on Semiconductor Electronics. p. 549-553 5 p. 4770385. (IEEE International Conference on Semiconductor Electronics, Proceedings, ICSE).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

FCPBGA with SOP pad finishing a study of lead-free solder ball attach improvement

Leng, E. P., Ling, W. T., Amin, N. & Ahmad, I., 01 Dec 2008, 10th Electronics Packaging Technology Conference, EPTC 2008. p. 1040-1045 6 p. 4763567. (10th Electronics Packaging Technology Conference, EPTC 2008).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Improved series resistance model for CMOS ESD diodes

Kamal, N. B., Kordesch, A. V. & Ahmad, I. B., 01 Dec 2008, ICSE 2008 Proceedings - 2008 IEEE International Conference on Semiconductor Electronics. p. 484-486 3 p. 4770369. (IEEE International Conference on Semiconductor Electronics, Proceedings, ICSE).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)